Wednesday, August 10, 2016

Faster and Fewer Patterns with Breakthrough ATPG to the Rescue

New semiconductor technologies like FinFETs are giving rise to new types of fault effects not covered by standard stuck-at and at-speed tests.

from EETimes: http://www.eetimes.com/author.asp?section_id=36&doc_id=1330283&_mc=RSS_EET_EDT

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